第三代
半导体测试家族
Third generation semiconductor testing family
分类
QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)
Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.
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Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | QT-8100 |
| Product Advantages |
The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc. |
| Key Features |
? Float V/I source with 4 quadrants ? Full resource extracted from the test box,support more than 8site test ? Digital speed 51.2MHz, vector depth 64M ? True parallel test, multiple 1000V/20A high voltage and high current ? 18 bit high precision sampling ? Multi-channel analog capability, supports up to 400 VI channels,Multi-channel digital capability, supports a maximum of 256VI channels ? Multi-channel high precision time measurement unit, supporting ns level time measurement ? Support RF module expansion ? Efficient communication configuration for more efficient testing |
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